Profile Fingerprint is based on mining the text of the experts' scientific documents to create an index of weighted terms, which defines the key subjects of each individual researcher.

Engineering & Materials Science

Grain boundaries
Electrons
Imaging techniques
Transmission electron microscopy
Gallium nitride
Nanowires
Nucleation
Microcracks
Single crystals
Dislocations (crystals)
Twinning
Crystal orientation
Electron diffraction
Multilayers
Titanium
Cracks
Crack tips
High resolution transmission electron microscopy
Trace analysis
Nanostructures
Microstructure
Plasticity
High resolution electron microscopy
Scanning electron microscopy
Crystals
Burgers vector
Substrates
Temperature
Intermetallics
Defects
Edge dislocations
Stacking faults
Screw dislocations
Electron energy loss spectroscopy
Diffraction
Crack propagation
Heavy ions
Atomic force microscopy
Electron microscopes
Ion bombardment
Creep
Crystalline materials
Sputter deposition
Giant magnetoresistance
Magnetic multilayers
Epitaxial growth
Spin glass
Plastic deformation
Scanning tunneling microscopy
Copper

Chemical Compounds

Grain boundaries
Electrons
Transmission electron microscopy
Imaging techniques
Nanowires
Nucleation
Single crystals
Titanium
Microcracks
Dislocations (crystals)
Twinning
Electron diffraction
Trace analysis
Crystal orientation
Plasticity
Nanostructures
High resolution electron microscopy
Multilayers
Microstructure
High resolution transmission electron microscopy
Burgers vector
Crystals
Cracks
Substrates
Intermetallics
Heavy Ions
Edge dislocations
Screw dislocations
Scanning electron microscopy
Electron energy loss spectroscopy
Diffraction
Temperature
Atomic force microscopy
Creep
Defects
Dysprosium
Sputter deposition
Electron microscopes
Ion bombardment
Giant magnetoresistance
Magnetic multilayers
Crack propagation
Epitaxial growth
Zinc
Stacking faults
Crack tips
Scanning tunneling microscopy
Joining
Crystalline materials
Nanoindentation

Physics & Astronomy

General

slip
transmission electron microscopy
grain boundaries
scanning electron microscopy
single crystals
electron microscopy
microcracks
edge dislocations
screw dislocations
nanostructure growth
microstructure
crystal defects
plastics
purity
cracks
examination
scanning tunneling microscopy
electron microscopes
catalysts
defects
microbalances

Engineering

nanowires
high resolution
Permalloys (trademark)
nucleation
crack tips
interlayers
ion irradiation
locking

Physics

electrons
electron diffraction
diffraction
heavy ions
diffraction patterns
temperature
visibility
electron energy

Chemistry and Materials

gallium nitrides
titanium
carbon
silicon
twinning
wurtzite
dysprosium
tensile creep
cermets
intermetallics
plastic properties
zirconium oxides
silicon dioxide