Profile Fingerprint is based on mining the text of the experts' scientific documents to create an index of weighted terms, which defines the key subjects of each individual researcher.

Engineering & Materials Science

Electrons
Grain boundaries
Imaging techniques
Transmission electron microscopy
Temperature
Nucleation
Single crystals
Nanowires
Cracks
Gallium nitride
Microcracks
Microstructure
Substrates
Scanning electron microscopy
Titanium
Multilayers
Dislocations (crystals)
Crystal orientation
Crystals
Nanostructures
Electron diffraction
Twinning
High resolution transmission electron microscopy
Plasticity
Crack tips
Defects
Intermetallics
Trace analysis
High resolution electron microscopy
Electron microscopes
Crack propagation
Atomic force microscopy
Creep
Diffraction
Burgers vector
Stacking faults
Heavy ions
Electron energy loss spectroscopy
Ion bombardment
Zinc
Screw dislocations
Epitaxial growth
Edge dislocations
Joining
Sputter deposition
Scanning tunneling microscopy
Giant magnetoresistance
Spin glass
Magnetic multilayers
Dysprosium

Chemical Compounds

Electrons
Grain boundaries
Imaging techniques
Transmission electron microscopy
Single crystals
Nucleation
Temperature
Nanowires
Microstructure
Titanium
Crystals
Substrates
Microcracks
Dislocations (crystals)
Electron diffraction
Nanostructures
Multilayers
Cracks
Crystal orientation
Plasticity
Scanning electron microscopy
Twinning
Defects
High resolution transmission electron microscopy
High resolution electron microscopy
Trace analysis
Intermetallics
Atomic force microscopy
Creep
Electron microscopes
Diffraction
Burgers vector
Crystalline materials
Crack propagation
Electron energy loss spectroscopy
Zinc
Screw dislocations
Epitaxial growth
Heavy Ions
Ion bombardment
Crack tips
Edge dislocations
Sputter deposition
Joining
Stacking faults
Scanning tunneling microscopy
Giant magnetoresistance
Nanoindentation
Dysprosium
Magnetic multilayers

Physics & Astronomy

Physics

electrons
temperature
electron diffraction
electron energy
heavy ions
diffraction patterns
visibility

General

transmission electron microscopy
slip
grain boundaries
scanning electron microscopy
single crystals
microstructure
electron microscopy
cracks
microcracks
purity
examination
catalysts
crystal defects
screw dislocations
electron microscopes
edge dislocations
plastics
scanning tunneling microscopy
energy dissipation
nanostructure growth
microbalances

Engineering

high resolution
nanowires
nucleation
Permalloys (trademark)
interlayers
crack tips
ion irradiation
locking

Chemistry and Materials

carbon
silicon
titanium
gallium nitrides
wurtzite
twinning
silicon dioxide
intermetallics
plastic properties
dysprosium
zirconium oxides
cermets
tensile creep