Profile Fingerprint is based on mining the text of the experts' scientific documents to create an index of weighted terms, which defines the key subjects of each individual researcher.

Engineering & Materials Science

Electrons
Grain boundaries
Imaging techniques
Transmission electron microscopy
Temperature
Nucleation
Single crystals
Nanowires
Cracks
Gallium nitride
Microcracks
Titanium
Microstructure
Substrates
Dislocations (crystals)
Scanning electron microscopy
Multilayers
Crystal orientation
Electron diffraction
Crystals
Nanostructures
Crack tips
Twinning
Defects
High resolution transmission electron microscopy
Plasticity
Intermetallics
Trace analysis
Diffraction
High resolution electron microscopy
Crystalline materials
Electron microscopes
Crack propagation
Atomic force microscopy
Creep
Burgers vector
Stacking faults
Heavy ions
Electron energy loss spectroscopy
Plastic deformation
Ion bombardment
Edge dislocations
Screw dislocations
Epitaxial growth
Sputter deposition
Scanning tunneling microscopy
Giant magnetoresistance
Spin glass
Magnetic multilayers
Dysprosium

Chemical Compounds

Electrons
Grain boundaries
Imaging techniques
Transmission electron microscopy
Single crystals
Nucleation
Temperature
Nanowires
Microstructure
Titanium
Crystals
Substrates
Microcracks
Dislocations (crystals)
Electron diffraction
Nanostructures
Multilayers
Cracks
Crystal orientation
Plasticity
Scanning electron microscopy
Twinning
Defects
High resolution transmission electron microscopy
High resolution electron microscopy
Diffraction
Trace analysis
Intermetallics
Atomic force microscopy
Creep
Electron microscopes
Burgers vector
Crystalline materials
Crack propagation
Electron energy loss spectroscopy
Zinc
Edge dislocations
Screw dislocations
Epitaxial growth
Heavy Ions
Ion bombardment
Crack tips
Sputter deposition
Joining
Stacking faults
Scanning tunneling microscopy
Giant magnetoresistance
Nanoindentation
Dysprosium
Magnetic multilayers

Physics & Astronomy

Physics

electrons
temperature
diffraction
electron diffraction
diffraction patterns
electron energy
heavy ions
visibility

General

transmission electron microscopy
slip
grain boundaries
scanning electron microscopy
single crystals
microstructure
electron microscopy
defects
plastics
cracks
microcracks
purity
examination
catalysts
crystal defects
edge dislocations
screw dislocations
electron microscopes
scanning tunneling microscopy
nanostructure growth
microbalances

Engineering

high resolution
nanowires
nucleation
Permalloys (trademark)
interlayers
crack tips
ion irradiation
locking

Chemistry and Materials

carbon
titanium
silicon
gallium nitrides
wurtzite
twinning
silicon dioxide
intermetallics
plastic properties
dysprosium
zirconium oxides
cermets
tensile creep