Accurate electron channeling contrast analysis of a low angle sub-grain boundary

H. Mansour, M. A. Crimp, N. Gey, N. Maloufi

    Research output: Research - peer-reviewArticle

    • 3 Citations

    Abstract

    High resolution selected area channeling pattern (HR-SACP) assisted accurate electron channeling contrast imaging (A-ECCI) was used to unambiguously characterize the structure of a low angle grain boundary in an interstitial-free-steel. The boundary dislocations were characterized using TEM-style contrast analysis. The boundary was determined to be tilt in nature with a misorientation angle of 0.13° consistent with the HR-SACP measurements. The results were verified using high accuracy electron backscatter diffraction (EBSD), confirming the approach as a discriminating tool for assessing low angle boundaries.

    LanguageEnglish (US)
    Article number10735
    Pages76-79
    Number of pages4
    JournalScripta Materialia
    Volume109
    DOIs
    StatePublished - Dec 1 2015

    Profile

    Steel
    Electron diffraction
    Grain boundaries
    Transmission electron microscopy
    Imaging techniques
    Electrons
    grain boundaries
    electrons
    high resolution
    misalignment
    interstitials
    steels
    transmission electron microscopy
    diffraction

    Keywords

    • Dislocation structure
    • Electron backscattering diffraction (EBSD)
    • Grain boundary structure
    • HR-SACP assisted ECCI
    • Misorientation

    ASJC Scopus subject areas

    • Materials Science(all)
    • Condensed Matter Physics

    Cite this

    Accurate electron channeling contrast analysis of a low angle sub-grain boundary. / Mansour, H.; Crimp, M. A.; Gey, N.; Maloufi, N.

    In: Scripta Materialia, Vol. 109, 10735, 01.12.2015, p. 76-79.

    Research output: Research - peer-reviewArticle

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