Characterizing Slip Transfer In Commercially Pure Titanium Using High Resolution Electron Backscatter Diffraction (HR-EBSD) and Electron Channeling Contrast Imaging (ECCI)

J. R. Seal, T. B. Britton, A. J. Wilkinson, T. R. Bieler, M. A. Crimp

    Research output: Contribution to journalArticle

    Original languageEnglish (US)
    Pages (from-to)702-703
    Number of pages2
    JournalMicroscopy and Microanalysis
    Volume18
    DOIs
    StatePublished - 2012

    ASJC Scopus subject areas

    • Instrumentation

    Cite this

    @article{153a78c02daf41dbad9f8c19a7ff2f5d,
    title = "Characterizing Slip Transfer In Commercially Pure Titanium Using High Resolution Electron Backscatter Diffraction (HR-EBSD) and Electron Channeling Contrast Imaging (ECCI)",
    author = "Seal, {J. R.} and Britton, {T. B.} and Wilkinson, {A. J.} and Bieler, {T. R.} and Crimp, {M. A.}",
    year = "2012",
    doi = "10.1017/S1431927612005363",
    volume = "18",
    pages = "702--703",
    journal = "Microscopy and Microanalysis",
    issn = "1431-9276",
    publisher = "Cambridge University Press",

    }

    TY - JOUR

    T1 - Characterizing Slip Transfer In Commercially Pure Titanium Using High Resolution Electron Backscatter Diffraction (HR-EBSD) and Electron Channeling Contrast Imaging (ECCI)

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    AU - Britton,T. B.

    AU - Wilkinson,A. J.

    AU - Bieler,T. R.

    AU - Crimp,M. A.

    PY - 2012

    Y1 - 2012

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    U2 - 10.1017/S1431927612005363

    DO - 10.1017/S1431927612005363

    M3 - Article

    VL - 18

    SP - 702

    EP - 703

    JO - Microscopy and Microanalysis

    T2 - Microscopy and Microanalysis

    JF - Microscopy and Microanalysis

    SN - 1431-9276

    ER -