Characterizing Slip Transfer In Commercially Pure Titanium Using High Resolution Electron Backscatter Diffraction (HR-EBSD) and Electron Channeling Contrast Imaging (ECCI)

J. R. Seal, T. B. Britton, A. J. Wilkinson, T. R. Bieler, M. A. Crimp

Research output: Contribution to journalArticle

  • 2 Citations
LanguageEnglish (US)
Pages702-703
Number of pages2
JournalMicroscopy and Microanalysis
Volume18
DOIs
StatePublished - 2012

Profile

Electron diffraction
slip
titanium
Titanium
Imaging techniques
Electrons
high resolution
diffraction
electrons

ASJC Scopus subject areas

  • Instrumentation

Cite this

@article{153a78c02daf41dbad9f8c19a7ff2f5d,
title = "Characterizing Slip Transfer In Commercially Pure Titanium Using High Resolution Electron Backscatter Diffraction (HR-EBSD) and Electron Channeling Contrast Imaging (ECCI)",
author = "Seal, {J. R.} and Britton, {T. B.} and Wilkinson, {A. J.} and Bieler, {T. R.} and Crimp, {M. A.}",
year = "2012",
doi = "10.1017/S1431927612005363",
language = "English (US)",
volume = "18",
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journal = "Microscopy and Microanalysis",
issn = "1431-9276",
publisher = "Cambridge University Press",

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AU - Wilkinson,A. J.

AU - Bieler,T. R.

AU - Crimp,M. A.

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