Comparison of dislocation characterization by electron channeling contrast imaging and cross-correlation electron backscattered diffraction

Bret E. Dunlap, Timothy J. Ruggles, David T. Fullwood, Brian Jackson, Martin A. Crimp

Research output: Contribution to journalArticle

Abstract

In this work, the relative capabilities and limitations of electron channeling contrast imaging (ECCI) and cross-correlation electron backscattered diffraction (CC-EBSD) have been assessed by studying the dislocation distributions resulting from nanoindentation in body centered cubic Ta. Qualitative comparison reveals very similar dislocation distributions between the CC-EBSD mapped GNDs and the ECC imaged dislocations. Approximate dislocation densities determined from ECC images compare well to those determined by CC-EBSD. Nevertheless, close examination reveals subtle differences in the details of the distributions mapped by these two approaches. The details of the dislocation Burgers vectors and line directions determined by ECCI have been compared to those determined using CC-EBSD and reveal good agreement.

Original languageEnglish (US)
Pages (from-to)125-133
Number of pages9
JournalUltramicroscopy
Volume184
DOIs
StatePublished - Jan 1 2018

Profile

Electron diffraction
cross correlation
electron diffraction
Adenofibroma
Electrons
Imaging techniques
electrons
Heart Mitochondria
Burgers vector
Dislocations (crystals)
Nanoindentation
nanoindentation
examination

Keywords

  • CC-EBSD
  • Dislocations
  • EBSD dislocation microscopy
  • ECCI
  • HR-EBSD
  • Nanoindentation

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Instrumentation

Cite this

Comparison of dislocation characterization by electron channeling contrast imaging and cross-correlation electron backscattered diffraction. / Dunlap, Bret E.; Ruggles, Timothy J.; Fullwood, David T.; Jackson, Brian; Crimp, Martin A.

In: Ultramicroscopy, Vol. 184, 01.01.2018, p. 125-133.

Research output: Contribution to journalArticle

Dunlap, Bret E.; Ruggles, Timothy J.; Fullwood, David T.; Jackson, Brian; Crimp, Martin A. / Comparison of dislocation characterization by electron channeling contrast imaging and cross-correlation electron backscattered diffraction.

In: Ultramicroscopy, Vol. 184, 01.01.2018, p. 125-133.

Research output: Contribution to journalArticle

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