Comparison of dislocation content measured with transmission electron microscopy and micro-Laue diffraction based streak analysis

C. Zhang, S. Balachandran, P. Eisenlohr, M. A. Crimp, C. Boehlert, R. Xu, T. R. Bieler

Research output: Research - peer-reviewArticle

Abstract

The subsurface dislocation content in a Ti-5Al-2.5Sn (wt%) uniaxial tension sample deformed at ambient temperature was characterized by peak streak analysis of micro-Laue diffraction patterns collected non-destructively by differential aperture X-ray microscopy, and with focused ion beam transmission electron microscopy of material in the same volume. This comparison reveals that micro-Laue diffraction streak analysis based on an edge dislocation assumption can accurately identify the dominant dislocation slip system history (Burgers vector and plane observed by TEM), despite the fact that dislocations have predominantly screw character. Other dislocations identified by TEM were not convincingly discernible from the peak streak analysis.

LanguageEnglish (US)
Pages74-77
Number of pages4
JournalScripta Materialia
Volume144
DOIs
StatePublished - Feb 1 2018

Profile

Diffraction
Transmission electron microscopy
transmission electron microscopy
diffraction
Burgers vector
Edge dislocations
Focused ion beams
Dislocations (crystals)
Diffraction patterns
Microscopic examination
X rays
Temperature
edge dislocations
screws
ambient temperature
slip
diffraction patterns
apertures
ion beams
histories

Keywords

  • Differential aperture X-ray microscopy (DAXM)
  • Geometrically necessary dislocations (GNDs)

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics

Cite this

Comparison of dislocation content measured with transmission electron microscopy and micro-Laue diffraction based streak analysis. / Zhang, C.; Balachandran, S.; Eisenlohr, P.; Crimp, M. A.; Boehlert, C.; Xu, R.; Bieler, T. R.

In: Scripta Materialia, Vol. 144, 01.02.2018, p. 74-77.

Research output: Research - peer-reviewArticle

Zhang, C. ; Balachandran, S. ; Eisenlohr, P. ; Crimp, M. A. ; Boehlert, C. ; Xu, R. ; Bieler, T. R./ Comparison of dislocation content measured with transmission electron microscopy and micro-Laue diffraction based streak analysis. In: Scripta Materialia. 2018 ; Vol. 144. pp. 74-77
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