Cross-section high resolution transmission electron microscopy and nanoprobe investigations of gallium nitride nanowires

Benjamin W. Jacobs, Kaylee McElroy, Raed A. Al-Duhaileb, Martin A. Crimp, Virginia M. Ayres, Richard E. Stallcup, Adam B. Hartman, Mary Anne Tupta

Research output: Contribution to journalArticle

Abstract

Gallium nitride nanowires and rods were grown by a vapour-solid growth mechanism over an 850-1,000°C furnace growth temperature range. Investigations by parallel (cross-section) high resolution transmission electron microscopy revealed correlated internal structures. The effects of the internal structures on electronic properties were investigated by micro- and nano-probe experiments. A space-charge limited interpretation of the observed non-linear I-V behaviour is examined.

LanguageEnglish (US)
Pages264-278
Number of pages15
JournalInternational Journal of Nanomanufacturing
Volume6
Issue number1-4
DOIs
StatePublished - Aug 2010

Profile

Nanoprobes
Gallium nitride
High resolution transmission electron microscopy
Nanowires
Growth temperature
Electric space charge
Electronic properties
Furnaces
Vapors
Experiments

Keywords

  • Cross-section
  • FIB
  • Focussed ion beam
  • Gallium nitride nanowire
  • High resolution transmission electron microscopy
  • HRTEM
  • Internal structure
  • Multiphase nanowire
  • Nanoelectronics
  • Nanoprobes
  • Transmission electron microscopy

ASJC Scopus subject areas

  • Industrial and Manufacturing Engineering

Cite this

Cross-section high resolution transmission electron microscopy and nanoprobe investigations of gallium nitride nanowires. / Jacobs, Benjamin W.; McElroy, Kaylee; Al-Duhaileb, Raed A.; Crimp, Martin A.; Ayres, Virginia M.; Stallcup, Richard E.; Hartman, Adam B.; Tupta, Mary Anne.

In: International Journal of Nanomanufacturing, Vol. 6, No. 1-4, 08.2010, p. 264-278.

Research output: Contribution to journalArticle

Jacobs, Benjamin W. ; McElroy, Kaylee ; Al-Duhaileb, Raed A. ; Crimp, Martin A. ; Ayres, Virginia M. ; Stallcup, Richard E. ; Hartman, Adam B. ; Tupta, Mary Anne. / Cross-section high resolution transmission electron microscopy and nanoprobe investigations of gallium nitride nanowires. In: International Journal of Nanomanufacturing. 2010 ; Vol. 6, No. 1-4. pp. 264-278
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