Cross-section high resolution transmission electron microscopy and nanoprobe investigations of gallium nitride nanowires

Benjamin W. Jacobs, Kaylee McElroy, Raed A. Al-Duhaileb, Martin A. Crimp, Virginia M. Ayres, Richard E. Stallcup, Adam B. Hartman, Mary Anne Tupta

    Research output: Contribution to journalArticle

    Abstract

    Gallium nitride nanowires and rods were grown by a vapour-solid growth mechanism over an 850-1,000°C furnace growth temperature range. Investigations by parallel (cross-section) high resolution transmission electron microscopy revealed correlated internal structures. The effects of the internal structures on electronic properties were investigated by micro- and nano-probe experiments. A space-charge limited interpretation of the observed non-linear I-V behaviour is examined.

    Original languageEnglish (US)
    Pages (from-to)264-278
    Number of pages15
    JournalInternational Journal of Nanomanufacturing
    Volume6
    Issue number1-4
    DOIs
    StatePublished - Aug 2010

    Profile

    Gallium nitride
    High resolution transmission electron microscopy
    Nanowires
    Nanoprobes
    Growth temperature
    Electric space charge
    Electronic properties
    Furnaces
    Vapors
    Experiments

    Keywords

    • Cross-section
    • FIB
    • Focussed ion beam
    • Gallium nitride nanowire
    • High resolution transmission electron microscopy
    • HRTEM
    • Internal structure
    • Multiphase nanowire
    • Nanoelectronics
    • Nanoprobes
    • Transmission electron microscopy

    ASJC Scopus subject areas

    • Industrial and Manufacturing Engineering

    Cite this

    Cross-section high resolution transmission electron microscopy and nanoprobe investigations of gallium nitride nanowires. / Jacobs, Benjamin W.; McElroy, Kaylee; Al-Duhaileb, Raed A.; Crimp, Martin A.; Ayres, Virginia M.; Stallcup, Richard E.; Hartman, Adam B.; Tupta, Mary Anne.

    In: International Journal of Nanomanufacturing, Vol. 6, No. 1-4, 08.2010, p. 264-278.

    Research output: Contribution to journalArticle

    Jacobs, Benjamin W.; McElroy, Kaylee; Al-Duhaileb, Raed A.; Crimp, Martin A.; Ayres, Virginia M.; Stallcup, Richard E.; Hartman, Adam B.; Tupta, Mary Anne / Cross-section high resolution transmission electron microscopy and nanoprobe investigations of gallium nitride nanowires.

    In: International Journal of Nanomanufacturing, Vol. 6, No. 1-4, 08.2010, p. 264-278.

    Research output: Contribution to journalArticle

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