Deformation Strength of Nanocrystalline Thin Films

Wolfgang Blum, P. Eisenlohr

    Research output: Research - peer-reviewArticle

    Abstract

    The data of deformation strength and microstructure of thin films of nanocrystalline Pd recently provided by Colla et al. have been analysed. It is shown that the properties of the films with cylindrical grains of 30 nm diameter extending over a significant portion of the film thickness (≈90 nm) are quantitatively comparable to what is known from nanocrystalline bulk material. This is explained in terms of boundary-mediated processes governing emission, storage, and recovery of dislocations.

    LanguageEnglish (US)
    JournalJournal of Materials Science and Technology
    DOIs
    StateAccepted/In press - Dec 28 2015

    Profile

    Film thickness
    Recovery
    Thin films
    Microstructure

    Keywords

    • Dislocations
    • Film
    • In situ
    • Nanocrystalline Pd
    • Stress relaxation
    • Thin

    ASJC Scopus subject areas

    • Ceramics and Composites
    • Mechanics of Materials
    • Mechanical Engineering
    • Polymers and Plastics
    • Metals and Alloys
    • Materials Chemistry

    Cite this

    Deformation Strength of Nanocrystalline Thin Films. / Blum, Wolfgang; Eisenlohr, P.

    In: Journal of Materials Science and Technology, 28.12.2015.

    Research output: Research - peer-reviewArticle

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