Development of high-temperature microsample testing

M. Zupan, M. J. Hayden, C. J. Boehlert, K. J. Hemker

Research output: Research - peer-reviewArticle

  • 47 Citations

Abstract

Microsample tensile testing has been established as a means of evaluating the room temperature mechanical properties of specimens with gage sections that are tens to hundreds of microns thick and several hundred microns wide. The desire to characterize the mechanical response of materials at elevated temperatures has motivated the development of high-temperature microsample testing that is reported here. The design of specially insulated grips allows the microsamples to be resistively heated using approximately 2 V DC and currents ranging between 2 to 6 A. An optical pyrometer with nominal spot size of 290 μm and 12 μm diameter type K thermocouples was employed to measure and verify the temperature of the microsamples. The ability of the pyrometer to accurately measure temperature on microsamples of different thicknesses and with slightly different emissivities was established over a temperature range from 400°C to 1100°C. The temperature gradient along the length and thickness of the microsample was measured, and the temperature difference measured in the gage section used for strain measurements was found to be less than 6.5°C. Examples of elevated temperature tensile and creep tests are presented.

LanguageEnglish (US)
Pages242-247
Number of pages6
JournalExperimental Mechanics
Volume41
Issue number3
StatePublished - Sep 2001
Externally publishedYes

Profile

High temperature testing
Temperature
Pyrometers
Gages
Strain measurement
Tensile testing
Thermocouples
Thermal gradients
Creep
Mechanical properties

Keywords

  • High temperature
  • Microsample
  • Tensile testing
  • TiAI

ASJC Scopus subject areas

  • Mechanics of Materials
  • Computational Mechanics

Cite this

Zupan, M., Hayden, M. J., Boehlert, C. J., & Hemker, K. J. (2001). Development of high-temperature microsample testing. Experimental Mechanics, 41(3), 242-247.

Development of high-temperature microsample testing. / Zupan, M.; Hayden, M. J.; Boehlert, C. J.; Hemker, K. J.

In: Experimental Mechanics, Vol. 41, No. 3, 09.2001, p. 242-247.

Research output: Research - peer-reviewArticle

Zupan, M, Hayden, MJ, Boehlert, CJ & Hemker, KJ 2001, 'Development of high-temperature microsample testing' Experimental Mechanics, vol 41, no. 3, pp. 242-247.
Zupan M, Hayden MJ, Boehlert CJ, Hemker KJ. Development of high-temperature microsample testing. Experimental Mechanics. 2001 Sep;41(3):242-247.
Zupan, M. ; Hayden, M. J. ; Boehlert, C. J. ; Hemker, K. J./ Development of high-temperature microsample testing. In: Experimental Mechanics. 2001 ; Vol. 41, No. 3. pp. 242-247
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