Electron backscattered diffraction characterization technique for analysis of a Ti2AlNb intermetallic alloy

G. L. Wynick, Carl J. Boehlert

    Research output: Contribution to journalArticle

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    Abstract

    This investigation was conducted to ascertain the benefits of electropolishing after mechanical polishing for electron backscattered diffraction of a Ti2AlNb intermetallic Ti-21Al-29Nb (at.%) alloy containing the orthorhombic (O) and body-centered-cubic (BCC) phases. Electropolishing was performed at -40 °C in 6% H2SO4 methanol solution. Atomic force microscopy was used to measure the surface topography in attempt to correlate nano-scale surface roughness with electron backscatter diffraction pattern quality. The results suggest that mechanically polishing with colloidal silica (SiO2) or alumina followed by electropolishing is a sufficient surface preparatory technique for producing quality electron backscattered diffraction patterns for O + BCC microstructures. However, poor pattern quality results after mechanically polishing without electropolishing. High-quality orientation maps for O-dominated O + BCC microstructures were only possible through mechanical polishing followed by electropolishing. The data also suggest that surface roughness, on the order of 50 nm, has less effect on pattern quality than sub-surface deformation. Overall, removing the near-surface damage was more critical than reduction of topography.

    Original languageEnglish (US)
    Pages (from-to)115-121
    Number of pages7
    JournalJournal of Microscopy
    Volume219
    Issue number3
    DOIs
    StatePublished - Sep 2005

    Profile

    electropolishing
    Electrolytic polishing
    Electrons
    polishing
    Polishing
    Electron diffraction
    electron diffraction
    intermetallics
    topography
    surface roughness
    diffraction patterns
    microstructure
    Diffraction patterns
    Intermetallics
    Surface roughness
    Microstructure
    Aluminum Oxide
    Atomic Force Microscopy
    Silicon Dioxide
    Methanol

    Keywords

    • Electron backscatter diffraction
    • Microstructure
    • Titanium alloy

    ASJC Scopus subject areas

    • Instrumentation

    Cite this

    Electron backscattered diffraction characterization technique for analysis of a Ti2AlNb intermetallic alloy. / Wynick, G. L.; Boehlert, Carl J.

    In: Journal of Microscopy, Vol. 219, No. 3, 09.2005, p. 115-121.

    Research output: Contribution to journalArticle

    Wynick, G. L.; Boehlert, Carl J. / Electron backscattered diffraction characterization technique for analysis of a Ti2AlNb intermetallic alloy.

    In: Journal of Microscopy, Vol. 219, No. 3, 09.2005, p. 115-121.

    Research output: Contribution to journalArticle

    @article{a67a4bbc6d054ff8a8d67ebd5e2cb5ba,
    title = "Electron backscattered diffraction characterization technique for analysis of a Ti2AlNb intermetallic alloy",
    abstract = "This investigation was conducted to ascertain the benefits of electropolishing after mechanical polishing for electron backscattered diffraction of a Ti2AlNb intermetallic Ti-21Al-29Nb (at.%) alloy containing the orthorhombic (O) and body-centered-cubic (BCC) phases. Electropolishing was performed at -40 °C in 6% H2SO4 methanol solution. Atomic force microscopy was used to measure the surface topography in attempt to correlate nano-scale surface roughness with electron backscatter diffraction pattern quality. The results suggest that mechanically polishing with colloidal silica (SiO2) or alumina followed by electropolishing is a sufficient surface preparatory technique for producing quality electron backscattered diffraction patterns for O + BCC microstructures. However, poor pattern quality results after mechanically polishing without electropolishing. High-quality orientation maps for O-dominated O + BCC microstructures were only possible through mechanical polishing followed by electropolishing. The data also suggest that surface roughness, on the order of 50 nm, has less effect on pattern quality than sub-surface deformation. Overall, removing the near-surface damage was more critical than reduction of topography.",
    keywords = "Electron backscatter diffraction, Microstructure, Titanium alloy",
    author = "Wynick, {G. L.} and Boehlert, {Carl J.}",
    year = "2005",
    month = "9",
    doi = "10.1111/j.1365-2818.2005.01499.x",
    volume = "219",
    pages = "115--121",
    journal = "Journal of Microscopy",
    issn = "0022-2720",
    publisher = "Wiley-Blackwell",
    number = "3",

    }

    TY - JOUR

    T1 - Electron backscattered diffraction characterization technique for analysis of a Ti2AlNb intermetallic alloy

    AU - Wynick,G. L.

    AU - Boehlert,Carl J.

    PY - 2005/9

    Y1 - 2005/9

    N2 - This investigation was conducted to ascertain the benefits of electropolishing after mechanical polishing for electron backscattered diffraction of a Ti2AlNb intermetallic Ti-21Al-29Nb (at.%) alloy containing the orthorhombic (O) and body-centered-cubic (BCC) phases. Electropolishing was performed at -40 °C in 6% H2SO4 methanol solution. Atomic force microscopy was used to measure the surface topography in attempt to correlate nano-scale surface roughness with electron backscatter diffraction pattern quality. The results suggest that mechanically polishing with colloidal silica (SiO2) or alumina followed by electropolishing is a sufficient surface preparatory technique for producing quality electron backscattered diffraction patterns for O + BCC microstructures. However, poor pattern quality results after mechanically polishing without electropolishing. High-quality orientation maps for O-dominated O + BCC microstructures were only possible through mechanical polishing followed by electropolishing. The data also suggest that surface roughness, on the order of 50 nm, has less effect on pattern quality than sub-surface deformation. Overall, removing the near-surface damage was more critical than reduction of topography.

    AB - This investigation was conducted to ascertain the benefits of electropolishing after mechanical polishing for electron backscattered diffraction of a Ti2AlNb intermetallic Ti-21Al-29Nb (at.%) alloy containing the orthorhombic (O) and body-centered-cubic (BCC) phases. Electropolishing was performed at -40 °C in 6% H2SO4 methanol solution. Atomic force microscopy was used to measure the surface topography in attempt to correlate nano-scale surface roughness with electron backscatter diffraction pattern quality. The results suggest that mechanically polishing with colloidal silica (SiO2) or alumina followed by electropolishing is a sufficient surface preparatory technique for producing quality electron backscattered diffraction patterns for O + BCC microstructures. However, poor pattern quality results after mechanically polishing without electropolishing. High-quality orientation maps for O-dominated O + BCC microstructures were only possible through mechanical polishing followed by electropolishing. The data also suggest that surface roughness, on the order of 50 nm, has less effect on pattern quality than sub-surface deformation. Overall, removing the near-surface damage was more critical than reduction of topography.

    KW - Electron backscatter diffraction

    KW - Microstructure

    KW - Titanium alloy

    UR - http://www.scopus.com/inward/record.url?scp=26244439853&partnerID=8YFLogxK

    UR - http://www.scopus.com/inward/citedby.url?scp=26244439853&partnerID=8YFLogxK

    U2 - 10.1111/j.1365-2818.2005.01499.x

    DO - 10.1111/j.1365-2818.2005.01499.x

    M3 - Article

    VL - 219

    SP - 115

    EP - 121

    JO - Journal of Microscopy

    T2 - Journal of Microscopy

    JF - Journal of Microscopy

    SN - 0022-2720

    IS - 3

    ER -