Identification of whisker grain in Sn coatings by analyzing crystallographic micro-texture using electron back-scatter diffraction

Piyush Jagtap, Aritra Chakraborty, Philip Eisenlohr, Praveen Kumar

    Research output: Research - peer-reviewArticle

    Abstract

    Here, we attempt to understand the age-old question of “where do whiskers in Sn coatings grow?” by performing grain orientation mapping in conjunction with a simple analysis of the stress field in the vicinity of a whisker grain. Electron back-scatter diffraction (EBSD) was used for orientation mapping of Sn grains in a 4 μm thick Sn coating deposited on brass. It was observed that whiskers consistently grew from low-index grains with (100) or near-(100) orientations that were surrounded by grains with similar orientations, which were then partially surrounded by grains with high-index planes, such as (211), (321) and (420). Strong elastic anisotropy and overall a high fraction of high-angle grain boundaries were also consistently observed in the vicinity of whiskers. In addition, a full-field three-dimensional crystal elasticity simulations were performed using the EBSD orientation maps to analyze local stress variations in the vicinity of the whisker grain. These simulations indicate the presence of a high compressive hydrostatic stress around the whisker grain, which could then possibly create conducive conditions for whisker growth observed experimentally.

    LanguageEnglish (US)
    Pages346-359
    Number of pages14
    JournalActa Materialia
    Volume134
    DOIs
    StatePublished - Aug 1 2017

    Profile

    Textures
    Diffraction
    Coatings
    Electrons
    Crystal orientation
    Elasticity
    Grain boundaries
    Anisotropy
    Crystals
    brass
    Brass

    Keywords

    • EBSD
    • Micro-texture mapping
    • Sn whisker
    • Stress field mapping
    • Whisker location

    ASJC Scopus subject areas

    • Electronic, Optical and Magnetic Materials
    • Ceramics and Composites
    • Polymers and Plastics
    • Metals and Alloys

    Cite this

    Identification of whisker grain in Sn coatings by analyzing crystallographic micro-texture using electron back-scatter diffraction. / Jagtap, Piyush; Chakraborty, Aritra; Eisenlohr, Philip; Kumar, Praveen.

    In: Acta Materialia, Vol. 134, 01.08.2017, p. 346-359.

    Research output: Research - peer-reviewArticle

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