Initial electron back-scattered diffraction observations of cerium

C. J. Boehlert, J. D. Farr, R. K. Schulze, R. A. Pereyra, J. A. Archuleta

Research output: Contribution to journalArticle

  • 5 Citations

Abstract

The first electron back-scattered diffraction Kikuchi patterns and grain orientation maps were captured for pure γ-phase (fcc) Ce. The sample preparation technique used for electron back-scattered diffraction orientation mapping of this surface-reactive metal included ion sputtering the surface using a scanning Auger microprobe followed by vacuum transfer of the sample from the scanning Auger microprobe to the scanning electron microscope. The effect of ion sputtering on the microstructure as well as preliminary electron back-scattered diffraction micro structural characterization is presented. Based on the sputtering data, the room-temperature diffusivity of O in γ-Ce was estimated.

Original languageEnglish (US)
Pages (from-to)1735-1744
Number of pages10
JournalPhilosophical Magazine
Volume83
Issue number14
DOIs
StatePublished - May 11 2003
Externally publishedYes

Profile

electrons
Microprobe
sputtering
scanning
diffraction
Microstructural characterization
Microstructure
Sample preparation
Scanning electron microscope
Metals
Temperature
cerium
diffusivity
metal ions
diffraction patterns
electron microscopes
vacuum
preparation
microstructure
room temperature

ASJC Scopus subject areas

  • Philosophy

Cite this

Boehlert, C. J., Farr, J. D., Schulze, R. K., Pereyra, R. A., & Archuleta, J. A. (2003). Initial electron back-scattered diffraction observations of cerium. Philosophical Magazine, 83(14), 1735-1744. DOI: 10.1080/1478643031000080708

Initial electron back-scattered diffraction observations of cerium. / Boehlert, C. J.; Farr, J. D.; Schulze, R. K.; Pereyra, R. A.; Archuleta, J. A.

In: Philosophical Magazine, Vol. 83, No. 14, 11.05.2003, p. 1735-1744.

Research output: Contribution to journalArticle

Boehlert, CJ, Farr, JD, Schulze, RK, Pereyra, RA & Archuleta, JA 2003, 'Initial electron back-scattered diffraction observations of cerium' Philosophical Magazine, vol 83, no. 14, pp. 1735-1744. DOI: 10.1080/1478643031000080708
Boehlert CJ, Farr JD, Schulze RK, Pereyra RA, Archuleta JA. Initial electron back-scattered diffraction observations of cerium. Philosophical Magazine. 2003 May 11;83(14):1735-1744. Available from, DOI: 10.1080/1478643031000080708

Boehlert, C. J.; Farr, J. D.; Schulze, R. K.; Pereyra, R. A.; Archuleta, J. A. / Initial electron back-scattered diffraction observations of cerium.

In: Philosophical Magazine, Vol. 83, No. 14, 11.05.2003, p. 1735-1744.

Research output: Contribution to journalArticle

@article{d86e57bdc3a34505ab831208168df67b,
title = "Initial electron back-scattered diffraction observations of cerium",
abstract = "The first electron back-scattered diffraction Kikuchi patterns and grain orientation maps were captured for pure γ-phase (fcc) Ce. The sample preparation technique used for electron back-scattered diffraction orientation mapping of this surface-reactive metal included ion sputtering the surface using a scanning Auger microprobe followed by vacuum transfer of the sample from the scanning Auger microprobe to the scanning electron microscope. The effect of ion sputtering on the microstructure as well as preliminary electron back-scattered diffraction micro structural characterization is presented. Based on the sputtering data, the room-temperature diffusivity of O in γ-Ce was estimated.",
author = "Boehlert, {C. J.} and Farr, {J. D.} and Schulze, {R. K.} and Pereyra, {R. A.} and Archuleta, {J. A.}",
year = "2003",
month = "5",
doi = "10.1080/1478643031000080708",
volume = "83",
pages = "1735--1744",
journal = "Philosophical Magazine",
issn = "1478-6435",
publisher = "Taylor and Francis Ltd.",
number = "14",

}

TY - JOUR

T1 - Initial electron back-scattered diffraction observations of cerium

AU - Boehlert,C. J.

AU - Farr,J. D.

AU - Schulze,R. K.

AU - Pereyra,R. A.

AU - Archuleta,J. A.

PY - 2003/5/11

Y1 - 2003/5/11

N2 - The first electron back-scattered diffraction Kikuchi patterns and grain orientation maps were captured for pure γ-phase (fcc) Ce. The sample preparation technique used for electron back-scattered diffraction orientation mapping of this surface-reactive metal included ion sputtering the surface using a scanning Auger microprobe followed by vacuum transfer of the sample from the scanning Auger microprobe to the scanning electron microscope. The effect of ion sputtering on the microstructure as well as preliminary electron back-scattered diffraction micro structural characterization is presented. Based on the sputtering data, the room-temperature diffusivity of O in γ-Ce was estimated.

AB - The first electron back-scattered diffraction Kikuchi patterns and grain orientation maps were captured for pure γ-phase (fcc) Ce. The sample preparation technique used for electron back-scattered diffraction orientation mapping of this surface-reactive metal included ion sputtering the surface using a scanning Auger microprobe followed by vacuum transfer of the sample from the scanning Auger microprobe to the scanning electron microscope. The effect of ion sputtering on the microstructure as well as preliminary electron back-scattered diffraction micro structural characterization is presented. Based on the sputtering data, the room-temperature diffusivity of O in γ-Ce was estimated.

UR - http://www.scopus.com/inward/record.url?scp=0242271401&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0242271401&partnerID=8YFLogxK

U2 - 10.1080/1478643031000080708

DO - 10.1080/1478643031000080708

M3 - Article

VL - 83

SP - 1735

EP - 1744

JO - Philosophical Magazine

T2 - Philosophical Magazine

JF - Philosophical Magazine

SN - 1478-6435

IS - 14

ER -