LOW BACKGROUND TESTING AT HONEYWELL.

Fernando Faria, Ken Overoye, Charles Petty

Research output: ResearchConference contribution

LanguageEnglish (US)
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
PublisherSPIE
Pages154-161
Number of pages8
Volume416
ISBN (Print)0892524510
StatePublished - 1983
Externally publishedYes

Profile

Sensor
Testing
Background
Sensors
sensors
Calibration
Flexibility
Scenarios
Design
flexibility
Radiometer
Emulation
Dynamic Range
Production Systems
Focal Plane
Simulator
Internal
Target
Necessary
Requirements

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Condensed Matter Physics

Cite this

Faria, F., Overoye, K., & Petty, C. (1983). LOW BACKGROUND TESTING AT HONEYWELL. In Proceedings of SPIE - The International Society for Optical Engineering (Vol. 416, pp. 154-161). SPIE.

LOW BACKGROUND TESTING AT HONEYWELL. / Faria, Fernando; Overoye, Ken; Petty, Charles.

Proceedings of SPIE - The International Society for Optical Engineering. Vol. 416 SPIE, 1983. p. 154-161.

Research output: ResearchConference contribution

Faria, F, Overoye, K & Petty, C 1983, LOW BACKGROUND TESTING AT HONEYWELL. in Proceedings of SPIE - The International Society for Optical Engineering. vol. 416, SPIE, pp. 154-161.
Faria F, Overoye K, Petty C. LOW BACKGROUND TESTING AT HONEYWELL. In Proceedings of SPIE - The International Society for Optical Engineering. Vol. 416. SPIE. 1983. p. 154-161.
Faria, Fernando ; Overoye, Ken ; Petty, Charles. / LOW BACKGROUND TESTING AT HONEYWELL.Proceedings of SPIE - The International Society for Optical Engineering. Vol. 416 SPIE, 1983. pp. 154-161
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