LOW BACKGROUND TESTING AT HONEYWELL.

Fernando Faria, Ken Overoye, Charles Petty

Research output: Chapter in Book/Report/Conference proceedingConference contribution

LanguageEnglish (US)
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
PublisherSPIE
Pages154-161
Number of pages8
Volume416
ISBN (Print)0892524510
StatePublished - 1983
Externally publishedYes

Profile

Sensor
Testing
Sensors
Optical collimators
sensors
Calibration
Flexibility
flexibility
Scenarios
Radiometer
Emulation
Radiometers
Dynamic Range
Production Systems
Focal Plane
dynamic stability
collimators
radiometers
Simulator
Simulators

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Condensed Matter Physics

Cite this

Faria, F., Overoye, K., & Petty, C. (1983). LOW BACKGROUND TESTING AT HONEYWELL. In Proceedings of SPIE - The International Society for Optical Engineering (Vol. 416, pp. 154-161). SPIE.

LOW BACKGROUND TESTING AT HONEYWELL. / Faria, Fernando; Overoye, Ken; Petty, Charles.

Proceedings of SPIE - The International Society for Optical Engineering. Vol. 416 SPIE, 1983. p. 154-161.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Faria, F, Overoye, K & Petty, C 1983, LOW BACKGROUND TESTING AT HONEYWELL. in Proceedings of SPIE - The International Society for Optical Engineering. vol. 416, SPIE, pp. 154-161.
Faria F, Overoye K, Petty C. LOW BACKGROUND TESTING AT HONEYWELL. In Proceedings of SPIE - The International Society for Optical Engineering. Vol. 416. SPIE. 1983. p. 154-161.
Faria, Fernando ; Overoye, Ken ; Petty, Charles. / LOW BACKGROUND TESTING AT HONEYWELL.Proceedings of SPIE - The International Society for Optical Engineering. Vol. 416 SPIE, 1983. pp. 154-161
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