Low temperature lanthanum strontium ferrite thin film stress and oxygen surface exchange coefficient measurements

    Research output: ResearchConference contribution

    • 1 Citations

    Abstract

    Mechano-chemical coupling of La0.6Sr0.4FeO 3-δ thin films were observed below 500°C for the first time using a curvature relaxation technique. Chemical oxygen surface exchange coefficients (k's) were measured by fitting the transient curvature of the thin film|substrate bilayer specimens under controlled temperature and oxygen partial pressure. Reproducible k values and their activation energies were obtained and are consistent with bulk sample k's extrapolated from the literature.

    LanguageEnglish (US)
    Title of host publicationECS Transactions
    PublisherElectrochemical Society Inc.
    Pages37-46
    Number of pages10
    Volume58
    Edition3
    DOIs
    StatePublished - 2013

    Profile

    Lanthanum
    Strontium
    Ferrite
    Thin films
    Oxygen
    Temperature
    Partial pressure
    Activation energy
    Substrates

    ASJC Scopus subject areas

    • Engineering(all)

    Cite this

    Low temperature lanthanum strontium ferrite thin film stress and oxygen surface exchange coefficient measurements. / Yang, Qing; Lunt, Richard R.; Nicholas, Jason D.

    ECS Transactions. Vol. 58 3. ed. Electrochemical Society Inc., 2013. p. 37-46.

    Research output: ResearchConference contribution

    Yang Q, Lunt RR, Nicholas JD. Low temperature lanthanum strontium ferrite thin film stress and oxygen surface exchange coefficient measurements. In ECS Transactions. 3 ed. Vol. 58. Electrochemical Society Inc.2013. p. 37-46. Available from, DOI: 10.1149/05803.0037ecst
    @inbook{7a7e25b16de14dfabdaee81438cf5f93,
    title = "Low temperature lanthanum strontium ferrite thin film stress and oxygen surface exchange coefficient measurements",
    abstract = "Mechano-chemical coupling of La0.6Sr0.4FeO 3-δ thin films were observed below 500°C for the first time using a curvature relaxation technique. Chemical oxygen surface exchange coefficients (k's) were measured by fitting the transient curvature of the thin film|substrate bilayer specimens under controlled temperature and oxygen partial pressure. Reproducible k values and their activation energies were obtained and are consistent with bulk sample k's extrapolated from the literature.",
    author = "Qing Yang and Lunt, {Richard R.} and Nicholas, {Jason D.}",
    year = "2013",
    doi = "10.1149/05803.0037ecst",
    volume = "58",
    pages = "37--46",
    booktitle = "ECS Transactions",
    publisher = "Electrochemical Society Inc.",
    edition = "3",

    }

    TY - CHAP

    T1 - Low temperature lanthanum strontium ferrite thin film stress and oxygen surface exchange coefficient measurements

    AU - Yang,Qing

    AU - Lunt,Richard R.

    AU - Nicholas,Jason D.

    PY - 2013

    Y1 - 2013

    N2 - Mechano-chemical coupling of La0.6Sr0.4FeO 3-δ thin films were observed below 500°C for the first time using a curvature relaxation technique. Chemical oxygen surface exchange coefficients (k's) were measured by fitting the transient curvature of the thin film|substrate bilayer specimens under controlled temperature and oxygen partial pressure. Reproducible k values and their activation energies were obtained and are consistent with bulk sample k's extrapolated from the literature.

    AB - Mechano-chemical coupling of La0.6Sr0.4FeO 3-δ thin films were observed below 500°C for the first time using a curvature relaxation technique. Chemical oxygen surface exchange coefficients (k's) were measured by fitting the transient curvature of the thin film|substrate bilayer specimens under controlled temperature and oxygen partial pressure. Reproducible k values and their activation energies were obtained and are consistent with bulk sample k's extrapolated from the literature.

    UR - http://www.scopus.com/inward/record.url?scp=84904884941&partnerID=8YFLogxK

    UR - http://www.scopus.com/inward/citedby.url?scp=84904884941&partnerID=8YFLogxK

    U2 - 10.1149/05803.0037ecst

    DO - 10.1149/05803.0037ecst

    M3 - Conference contribution

    VL - 58

    SP - 37

    EP - 46

    BT - ECS Transactions

    PB - Electrochemical Society Inc.

    ER -