Low temperature lanthanum strontium ferrite thin film stress and oxygen surface exchange coefficient measurements

Research output: Chapter in Book/Report/Conference proceedingConference contribution

  • 1 Citations

Abstract

Mechano-chemical coupling of La0.6Sr0.4FeO 3-δ thin films were observed below 500°C for the first time using a curvature relaxation technique. Chemical oxygen surface exchange coefficients (k's) were measured by fitting the transient curvature of the thin film|substrate bilayer specimens under controlled temperature and oxygen partial pressure. Reproducible k values and their activation energies were obtained and are consistent with bulk sample k's extrapolated from the literature.

LanguageEnglish (US)
Title of host publicationECS Transactions
PublisherElectrochemical Society Inc.
Pages37-46
Number of pages10
Volume58
Edition3
DOIs
StatePublished - 2013

Profile

Lanthanum
Strontium
Ferrite
Thin films
Oxygen
Partial pressure
Activation energy
Temperature
Substrates

ASJC Scopus subject areas

  • Engineering(all)

Cite this

Low temperature lanthanum strontium ferrite thin film stress and oxygen surface exchange coefficient measurements. / Yang, Qing; Lunt, Richard R.; Nicholas, Jason D.

ECS Transactions. Vol. 58 3. ed. Electrochemical Society Inc., 2013. p. 37-46.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Yang Q, Lunt RR, Nicholas JD. Low temperature lanthanum strontium ferrite thin film stress and oxygen surface exchange coefficient measurements. In ECS Transactions. 3 ed. Vol. 58. Electrochemical Society Inc.2013. p. 37-46. Available from, DOI: 10.1149/05803.0037ecst
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