Mechanical twinning and detwinning in pure Ti during loading and unloading - An in situ high-energy X-ray diffraction microscopy study

L. Wang, J. Lind, H. Phukan, P. Kenesei, J. S. Park, R. M. Suter, A. J. Beaudoin, T. R. Bieler

    Research output: Contribution to journalArticle

    • 14 Citations

    Abstract

    Far-field high-energy X-ray diffraction microscopy (HEDM) was used to study {1 0 1¯ 2}〉1¯ 0 1 1〈 twinning in Ti. Twin nucleation within a bulk parent grain is observed at a resolved shear stress (RSS) of 225 MPa. During unloading, the RSS on the twin plane reversed sign, providing a driving force for detwinning. Formation of the twin, however, prevented the parent grain from returning to its original stress state even after complete unloading. The twin morphology and surrounding environment were examined using near-field HEDM.

    Original languageEnglish (US)
    Pages (from-to)35-38
    Number of pages4
    JournalScripta Materialia
    Volume92
    DOIs
    StatePublished - Dec 1 2014

    Profile

    unloading
    microscopy
    diffraction
    energy
    Biophysics
    Child Behavior
    Fetal Development
    Unloading
    Microscopic examination
    X ray diffraction
    shear stress
    Protamine Kinase
    Twinning
    Shear stress
    mechanical twinning
    twinning
    far fields
    near fields
    nucleation
    Hospital Dental Service

    Keywords

    • Detwinning
    • High-energy
    • In situ mechanical testing
    • Titanium
    • Twinning
    • X-ray diffraction microscopy

    ASJC Scopus subject areas

    • Materials Science(all)
    • Condensed Matter Physics

    Cite this

    Mechanical twinning and detwinning in pure Ti during loading and unloading - An in situ high-energy X-ray diffraction microscopy study. / Wang, L.; Lind, J.; Phukan, H.; Kenesei, P.; Park, J. S.; Suter, R. M.; Beaudoin, A. J.; Bieler, T. R.

    In: Scripta Materialia, Vol. 92, 01.12.2014, p. 35-38.

    Research output: Contribution to journalArticle

    Wang, L.; Lind, J.; Phukan, H.; Kenesei, P.; Park, J. S.; Suter, R. M.; Beaudoin, A. J.; Bieler, T. R. / Mechanical twinning and detwinning in pure Ti during loading and unloading - An in situ high-energy X-ray diffraction microscopy study.

    In: Scripta Materialia, Vol. 92, 01.12.2014, p. 35-38.

    Research output: Contribution to journalArticle

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    abstract = "Far-field high-energy X-ray diffraction microscopy (HEDM) was used to study {1 0 1¯ 2}〉1¯ 0 1 1〈 twinning in Ti. Twin nucleation within a bulk parent grain is observed at a resolved shear stress (RSS) of 225 MPa. During unloading, the RSS on the twin plane reversed sign, providing a driving force for detwinning. Formation of the twin, however, prevented the parent grain from returning to its original stress state even after complete unloading. The twin morphology and surrounding environment were examined using near-field HEDM.",
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    AU - Phukan,H.

    AU - Kenesei,P.

    AU - Park,J. S.

    AU - Suter,R. M.

    AU - Beaudoin,A. J.

    AU - Bieler,T. R.

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