Microstructural characterization of polycrystalline materials by synchrotron X-rays

Leyun Wang, Meimei Li, Jonathan Almer, Thomas Bieler, Rozaliya Barabash

    Research output: Research - peer-reviewArticle

    • 12 Citations

    Abstract

    Third generation synchrotron X-rays provide an unprecedented opportunity for microstructural characterization of many engineering materials as well as natural materials. This article demonstrates the usage of three techniques for the study of structural materials: differential-aperture X-ray microscopy (DAXM), three-dimensional X-ray diffraction (3DXRD), and simultaneous wide angle/small angle X-ray scattering (WAXS/SAXS). DAXM is able to measure the 3D grain structure in polycrystalline materials with high spatial and angular resolution. In a deformed material, streaked diffraction peaks can be used to analyze local dislocation content in individual grains. Compared to DAXM, 3DXRD is able to map grains in bulk materials more quickly at the expense of spatial resolution. It is very useful for studying evolving microstructures when the materials are under deformation. WAXS/SAXS is suitable for studying materials with inhomogeneous structure, such as precipitate strengthened alloys. Structural information revealed by WAXS and SAXS can be combined for a deeper insight into material behavior. Future development and applications of these three techniques will also be discussed.

    LanguageEnglish (US)
    Pages156-169
    Number of pages14
    JournalFrontiers of Materials Science
    Volume7
    Issue number2
    DOIs
    StatePublished - Jun 2013

    Profile

    Polycrystalline materials
    Synchrotrons
    X rays
    Microscopic examination
    Crystal microstructure
    X ray scattering
    Precipitates
    Diffraction
    X ray diffraction
    Microstructure

    Keywords

    • differential-aperture X-ray microscopy (DAXM)
    • three-dimensional X-ray diffraction (3DXRD)
    • wide angle/small angle X-ray scattering (WAXS/SAXS)

    ASJC Scopus subject areas

    • Materials Science(all)

    Cite this

    Microstructural characterization of polycrystalline materials by synchrotron X-rays. / Wang, Leyun; Li, Meimei; Almer, Jonathan; Bieler, Thomas; Barabash, Rozaliya.

    In: Frontiers of Materials Science, Vol. 7, No. 2, 06.2013, p. 156-169.

    Research output: Research - peer-reviewArticle

    Wang, Leyun ; Li, Meimei ; Almer, Jonathan ; Bieler, Thomas ; Barabash, Rozaliya. / Microstructural characterization of polycrystalline materials by synchrotron X-rays. In: Frontiers of Materials Science. 2013 ; Vol. 7, No. 2. pp. 156-169
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