Near-field microwave magnetic nanoscopy of superconducting radio frequency cavity materials

Tamin Tai, Behnood G. Ghamsari, Thomas R. Bieler, Teng Tan, X. X. Xi, Steven M. Anlage

    Research output: Research - peer-reviewArticle

    • 5 Citations

    Abstract

    A localized measurement of the RF critical field on superconducting radio frequency (SRF) cavity materials is a key step to identify specific defects that produce quenches of SRF cavities. Two measurements are performed to demonstrate these capabilities with a near-field scanning probe microwave microscope. The first is a third harmonic nonlinear measurement on a high Residual-Resistance- Ratio bulk Nb sample showing strong localized nonlinear response, with surface RF magnetic field Bsurface∼ 102 mT. The second is a raster scanned harmonic response image on a MgB2 thin film demonstrating a uniform nonlinear response over large areas.

    LanguageEnglish (US)
    Article number232603
    JournalApplied Physics Letters
    Volume104
    Issue number23
    DOIs
    StatePublished - Jun 9 2014

    Profile

    near fields
    radio frequencies
    microwaves
    cavities
    harmonics
    microwave probes
    microscopes
    scanning
    defects
    thin films
    magnetic fields

    ASJC Scopus subject areas

    • Physics and Astronomy (miscellaneous)

    Cite this

    Tai, T., Ghamsari, B. G., Bieler, T. R., Tan, T., Xi, X. X., & Anlage, S. M. (2014). Near-field microwave magnetic nanoscopy of superconducting radio frequency cavity materials. Applied Physics Letters, 104(23), [232603]. DOI: 10.1063/1.4881880

    Near-field microwave magnetic nanoscopy of superconducting radio frequency cavity materials. / Tai, Tamin; Ghamsari, Behnood G.; Bieler, Thomas R.; Tan, Teng; Xi, X. X.; Anlage, Steven M.

    In: Applied Physics Letters, Vol. 104, No. 23, 232603, 09.06.2014.

    Research output: Research - peer-reviewArticle

    Tai T, Ghamsari BG, Bieler TR, Tan T, Xi XX, Anlage SM. Near-field microwave magnetic nanoscopy of superconducting radio frequency cavity materials. Applied Physics Letters. 2014 Jun 9;104(23). 232603. Available from, DOI: 10.1063/1.4881880
    Tai, Tamin ; Ghamsari, Behnood G. ; Bieler, Thomas R. ; Tan, Teng ; Xi, X. X. ; Anlage, Steven M./ Near-field microwave magnetic nanoscopy of superconducting radio frequency cavity materials. In: Applied Physics Letters. 2014 ; Vol. 104, No. 23.
    @article{2e486b67b11f428eb3c6d5af74606fc5,
    title = "Near-field microwave magnetic nanoscopy of superconducting radio frequency cavity materials",
    abstract = "A localized measurement of the RF critical field on superconducting radio frequency (SRF) cavity materials is a key step to identify specific defects that produce quenches of SRF cavities. Two measurements are performed to demonstrate these capabilities with a near-field scanning probe microwave microscope. The first is a third harmonic nonlinear measurement on a high Residual-Resistance- Ratio bulk Nb sample showing strong localized nonlinear response, with surface RF magnetic field Bsurface∼ 102 mT. The second is a raster scanned harmonic response image on a MgB2 thin film demonstrating a uniform nonlinear response over large areas.",
    author = "Tamin Tai and Ghamsari, {Behnood G.} and Bieler, {Thomas R.} and Teng Tan and Xi, {X. X.} and Anlage, {Steven M.}",
    year = "2014",
    month = "6",
    doi = "10.1063/1.4881880",
    volume = "104",
    journal = "Applied Physics Letters",
    issn = "0003-6951",
    publisher = "American Institute of Physics Publising LLC",
    number = "23",

    }

    TY - JOUR

    T1 - Near-field microwave magnetic nanoscopy of superconducting radio frequency cavity materials

    AU - Tai,Tamin

    AU - Ghamsari,Behnood G.

    AU - Bieler,Thomas R.

    AU - Tan,Teng

    AU - Xi,X. X.

    AU - Anlage,Steven M.

    PY - 2014/6/9

    Y1 - 2014/6/9

    N2 - A localized measurement of the RF critical field on superconducting radio frequency (SRF) cavity materials is a key step to identify specific defects that produce quenches of SRF cavities. Two measurements are performed to demonstrate these capabilities with a near-field scanning probe microwave microscope. The first is a third harmonic nonlinear measurement on a high Residual-Resistance- Ratio bulk Nb sample showing strong localized nonlinear response, with surface RF magnetic field Bsurface∼ 102 mT. The second is a raster scanned harmonic response image on a MgB2 thin film demonstrating a uniform nonlinear response over large areas.

    AB - A localized measurement of the RF critical field on superconducting radio frequency (SRF) cavity materials is a key step to identify specific defects that produce quenches of SRF cavities. Two measurements are performed to demonstrate these capabilities with a near-field scanning probe microwave microscope. The first is a third harmonic nonlinear measurement on a high Residual-Resistance- Ratio bulk Nb sample showing strong localized nonlinear response, with surface RF magnetic field Bsurface∼ 102 mT. The second is a raster scanned harmonic response image on a MgB2 thin film demonstrating a uniform nonlinear response over large areas.

    UR - http://www.scopus.com/inward/record.url?scp=84902491498&partnerID=8YFLogxK

    UR - http://www.scopus.com/inward/citedby.url?scp=84902491498&partnerID=8YFLogxK

    U2 - 10.1063/1.4881880

    DO - 10.1063/1.4881880

    M3 - Article

    VL - 104

    JO - Applied Physics Letters

    T2 - Applied Physics Letters

    JF - Applied Physics Letters

    SN - 0003-6951

    IS - 23

    M1 - 232603

    ER -