Practical considerations for reliable stress and oxygen surface exchange coefficients from bilayer curvature relaxation measurements

    Research output: Contribution to journalArticle

    • 2 Citations

    Abstract

    The curvature relaxation technique is a new electrode-free method for simultaneously measuring a material's chemical oxygen surface exchange coefficient and stress state under controlled atmosphere and temperature conditions. Provided certain conditions are met, this in situ/in operando technique can be used to accurately measure the oxygen surface exchange coefficients and stress states of dense, porous, thin, or thick film oxygen exchange materials. The present paper provides a detailed, practical discussion of these conditions and compares the curvature relaxation technique to alternative oxygen surface exchange coefficient measurement approaches.

    Original languageEnglish (US)
    JournalExtreme Mechanics Letters
    DOIs
    StateAccepted/In press - Jan 2 2016

    Profile

    Oxygen
    Edema Disease of Swine
    Addison Disease
    Buccal Administration
    Traffic Accidents
    Acetanilides
    Alcuronium
    Amsacrine
    Autoradiography
    Thick films
    Thin films
    Protective atmospheres
    Electrodes
    Temperature

    Keywords

    • Chemical strain
    • Chemical stress
    • Curvature relaxation
    • Mechano-chemical coupling
    • Mechano-chemically active
    • Oxygen surface exchange
    • Thin film

    ASJC Scopus subject areas

    • Chemical Engineering (miscellaneous)
    • Bioengineering
    • Engineering (miscellaneous)
    • Mechanical Engineering
    • Mechanics of Materials

    Cite this

    @article{2363982abe29415c92f4dcf066842bfb,
    title = "Practical considerations for reliable stress and oxygen surface exchange coefficients from bilayer curvature relaxation measurements",
    abstract = "The curvature relaxation technique is a new electrode-free method for simultaneously measuring a material's chemical oxygen surface exchange coefficient and stress state under controlled atmosphere and temperature conditions. Provided certain conditions are met, this in situ/in operando technique can be used to accurately measure the oxygen surface exchange coefficients and stress states of dense, porous, thin, or thick film oxygen exchange materials. The present paper provides a detailed, practical discussion of these conditions and compares the curvature relaxation technique to alternative oxygen surface exchange coefficient measurement approaches.",
    keywords = "Chemical strain, Chemical stress, Curvature relaxation, Mechano-chemical coupling, Mechano-chemically active, Oxygen surface exchange, Thin film",
    author = "Nicholas, {Jason D.}",
    year = "2016",
    month = "1",
    doi = "10.1016/j.eml.2016.04.006",
    journal = "Extreme Mechanics Letters",
    issn = "2352-4316",
    publisher = "Elsevier Limited",

    }

    TY - JOUR

    T1 - Practical considerations for reliable stress and oxygen surface exchange coefficients from bilayer curvature relaxation measurements

    AU - Nicholas,Jason D.

    PY - 2016/1/2

    Y1 - 2016/1/2

    N2 - The curvature relaxation technique is a new electrode-free method for simultaneously measuring a material's chemical oxygen surface exchange coefficient and stress state under controlled atmosphere and temperature conditions. Provided certain conditions are met, this in situ/in operando technique can be used to accurately measure the oxygen surface exchange coefficients and stress states of dense, porous, thin, or thick film oxygen exchange materials. The present paper provides a detailed, practical discussion of these conditions and compares the curvature relaxation technique to alternative oxygen surface exchange coefficient measurement approaches.

    AB - The curvature relaxation technique is a new electrode-free method for simultaneously measuring a material's chemical oxygen surface exchange coefficient and stress state under controlled atmosphere and temperature conditions. Provided certain conditions are met, this in situ/in operando technique can be used to accurately measure the oxygen surface exchange coefficients and stress states of dense, porous, thin, or thick film oxygen exchange materials. The present paper provides a detailed, practical discussion of these conditions and compares the curvature relaxation technique to alternative oxygen surface exchange coefficient measurement approaches.

    KW - Chemical strain

    KW - Chemical stress

    KW - Curvature relaxation

    KW - Mechano-chemical coupling

    KW - Mechano-chemically active

    KW - Oxygen surface exchange

    KW - Thin film

    UR - http://www.scopus.com/inward/record.url?scp=84973468758&partnerID=8YFLogxK

    UR - http://www.scopus.com/inward/citedby.url?scp=84973468758&partnerID=8YFLogxK

    U2 - 10.1016/j.eml.2016.04.006

    DO - 10.1016/j.eml.2016.04.006

    M3 - Article

    JO - Extreme Mechanics Letters

    T2 - Extreme Mechanics Letters

    JF - Extreme Mechanics Letters

    SN - 2352-4316

    ER -