Practical considerations for reliable stress and oxygen surface exchange coefficients from bilayer curvature relaxation measurements

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Abstract

The curvature relaxation technique is a new electrode-free method for simultaneously measuring a material's chemical oxygen surface exchange coefficient and stress state under controlled atmosphere and temperature conditions. Provided certain conditions are met, this in situ/in operando technique can be used to accurately measure the oxygen surface exchange coefficients and stress states of dense, porous, thin, or thick film oxygen exchange materials. The present paper provides a detailed, practical discussion of these conditions and compares the curvature relaxation technique to alternative oxygen surface exchange coefficient measurement approaches.

LanguageEnglish (US)
JournalExtreme Mechanics Letters
DOIs
StateAccepted/In press - Jan 2 2016

Profile

Oxygen
Thick films
Protective atmospheres
Thin films
Electrodes
Temperature

Keywords

  • Chemical strain
  • Chemical stress
  • Curvature relaxation
  • Mechano-chemical coupling
  • Mechano-chemically active
  • Oxygen surface exchange
  • Thin film

ASJC Scopus subject areas

  • Chemical Engineering (miscellaneous)
  • Bioengineering
  • Engineering (miscellaneous)
  • Mechanical Engineering
  • Mechanics of Materials

Cite this

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abstract = "The curvature relaxation technique is a new electrode-free method for simultaneously measuring a material's chemical oxygen surface exchange coefficient and stress state under controlled atmosphere and temperature conditions. Provided certain conditions are met, this in situ/in operando technique can be used to accurately measure the oxygen surface exchange coefficients and stress states of dense, porous, thin, or thick film oxygen exchange materials. The present paper provides a detailed, practical discussion of these conditions and compares the curvature relaxation technique to alternative oxygen surface exchange coefficient measurement approaches.",
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AB - The curvature relaxation technique is a new electrode-free method for simultaneously measuring a material's chemical oxygen surface exchange coefficient and stress state under controlled atmosphere and temperature conditions. Provided certain conditions are met, this in situ/in operando technique can be used to accurately measure the oxygen surface exchange coefficients and stress states of dense, porous, thin, or thick film oxygen exchange materials. The present paper provides a detailed, practical discussion of these conditions and compares the curvature relaxation technique to alternative oxygen surface exchange coefficient measurement approaches.

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KW - Mechano-chemically active

KW - Oxygen surface exchange

KW - Thin film

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