SiC-based cermet with electrically conductive grain boundaries

M. Balog, J. Kováč, A. Šatka, D. Haško, J. Zhang, M. A. Crimp, O. Vávra, I. Vávra

    Research output: Contribution to journalArticle

    • 3 Citations

    Abstract

    The present paper deals with the characterization of structural and electrical properties of SiC-based cermets prepared by in situ reaction. The surface structure and electrical conductivity of the samples was investigated by the standard four-point probe method, SEM, TEM, AFM, and STM techniques. It was found that the electrical conductivity of the SiC-based ceramic-metal composites increases with increased fraction of metallic phases. Interestingly, samples containing app. 12 vol.% of non-percolated (isolated) metallic phases exhibit up to 2 orders of magnitude better electrical conductivity compared with the base-line liquid phase sintered SiC (LPS SiC). This effect results from doping of the SiC grains by diffusion of metallic components as well as from chemical modification of the grain boundary phases due to the reaction of sintering aids and metallic particles at high sintering temperatures. Absorbed current measurements using SEM, as well as AFM in spreading resistance and STM in tunneling mode were used for visualization of electrical pathways.

    Original languageEnglish (US)
    Pages (from-to)420-426
    Number of pages7
    JournalMaterials Characterization
    Volume61
    Issue number4
    DOIs
    StatePublished - Apr 2010

    Profile

    Electric Conductivity
    electrical resistivity
    Cuba
    Grain boundaries
    Sintering
    Scanning electron microscopy
    Cermets
    cermets
    sintering
    grain boundaries
    atomic force microscopy
    scanning electron microscopy
    Acetanilides
    Feline Sarcoma Viruses
    Thiadiazines
    Computing Methodologies
    Birth Certificates
    Acromegaly
    Arteriovenous Fistula
    Chemical modification

    Keywords

    • AFM
    • Cermets
    • Diffusion
    • Electrical conductivity
    • Grain boundaries
    • SEM
    • STM
    • TEM

    ASJC Scopus subject areas

    • Mechanical Engineering
    • Mechanics of Materials
    • Materials Science(all)
    • Condensed Matter Physics

    Cite this

    Balog, M., Kováč, J., Šatka, A., Haško, D., Zhang, J., Crimp, M. A., ... Vávra, I. (2010). SiC-based cermet with electrically conductive grain boundaries. Materials Characterization, 61(4), 420-426. DOI: 10.1016/j.matchar.2010.01.010

    SiC-based cermet with electrically conductive grain boundaries. / Balog, M.; Kováč, J.; Šatka, A.; Haško, D.; Zhang, J.; Crimp, M. A.; Vávra, O.; Vávra, I.

    In: Materials Characterization, Vol. 61, No. 4, 04.2010, p. 420-426.

    Research output: Contribution to journalArticle

    Balog, M, Kováč, J, Šatka, A, Haško, D, Zhang, J, Crimp, MA, Vávra, O & Vávra, I 2010, 'SiC-based cermet with electrically conductive grain boundaries' Materials Characterization, vol 61, no. 4, pp. 420-426. DOI: 10.1016/j.matchar.2010.01.010
    Balog M, Kováč J, Šatka A, Haško D, Zhang J, Crimp MA et al. SiC-based cermet with electrically conductive grain boundaries. Materials Characterization. 2010 Apr;61(4):420-426. Available from, DOI: 10.1016/j.matchar.2010.01.010

    Balog, M.; Kováč, J.; Šatka, A.; Haško, D.; Zhang, J.; Crimp, M. A.; Vávra, O.; Vávra, I. / SiC-based cermet with electrically conductive grain boundaries.

    In: Materials Characterization, Vol. 61, No. 4, 04.2010, p. 420-426.

    Research output: Contribution to journalArticle

    @article{869237a5ad2d4c85966c3fef02758c27,
    title = "SiC-based cermet with electrically conductive grain boundaries",
    abstract = "The present paper deals with the characterization of structural and electrical properties of SiC-based cermets prepared by in situ reaction. The surface structure and electrical conductivity of the samples was investigated by the standard four-point probe method, SEM, TEM, AFM, and STM techniques. It was found that the electrical conductivity of the SiC-based ceramic-metal composites increases with increased fraction of metallic phases. Interestingly, samples containing app. 12 vol.% of non-percolated (isolated) metallic phases exhibit up to 2 orders of magnitude better electrical conductivity compared with the base-line liquid phase sintered SiC (LPS SiC). This effect results from doping of the SiC grains by diffusion of metallic components as well as from chemical modification of the grain boundary phases due to the reaction of sintering aids and metallic particles at high sintering temperatures. Absorbed current measurements using SEM, as well as AFM in spreading resistance and STM in tunneling mode were used for visualization of electrical pathways.",
    keywords = "AFM, Cermets, Diffusion, Electrical conductivity, Grain boundaries, SEM, STM, TEM",
    author = "M. Balog and J. Kováč and A. Šatka and D. Haško and J. Zhang and Crimp, {M. A.} and O. Vávra and I. Vávra",
    year = "2010",
    month = "4",
    doi = "10.1016/j.matchar.2010.01.010",
    volume = "61",
    pages = "420--426",
    journal = "Materials Characterization",
    issn = "1044-5803",
    publisher = "Elsevier Inc.",
    number = "4",

    }

    TY - JOUR

    T1 - SiC-based cermet with electrically conductive grain boundaries

    AU - Balog,M.

    AU - Kováč,J.

    AU - Šatka,A.

    AU - Haško,D.

    AU - Zhang,J.

    AU - Crimp,M. A.

    AU - Vávra,O.

    AU - Vávra,I.

    PY - 2010/4

    Y1 - 2010/4

    N2 - The present paper deals with the characterization of structural and electrical properties of SiC-based cermets prepared by in situ reaction. The surface structure and electrical conductivity of the samples was investigated by the standard four-point probe method, SEM, TEM, AFM, and STM techniques. It was found that the electrical conductivity of the SiC-based ceramic-metal composites increases with increased fraction of metallic phases. Interestingly, samples containing app. 12 vol.% of non-percolated (isolated) metallic phases exhibit up to 2 orders of magnitude better electrical conductivity compared with the base-line liquid phase sintered SiC (LPS SiC). This effect results from doping of the SiC grains by diffusion of metallic components as well as from chemical modification of the grain boundary phases due to the reaction of sintering aids and metallic particles at high sintering temperatures. Absorbed current measurements using SEM, as well as AFM in spreading resistance and STM in tunneling mode were used for visualization of electrical pathways.

    AB - The present paper deals with the characterization of structural and electrical properties of SiC-based cermets prepared by in situ reaction. The surface structure and electrical conductivity of the samples was investigated by the standard four-point probe method, SEM, TEM, AFM, and STM techniques. It was found that the electrical conductivity of the SiC-based ceramic-metal composites increases with increased fraction of metallic phases. Interestingly, samples containing app. 12 vol.% of non-percolated (isolated) metallic phases exhibit up to 2 orders of magnitude better electrical conductivity compared with the base-line liquid phase sintered SiC (LPS SiC). This effect results from doping of the SiC grains by diffusion of metallic components as well as from chemical modification of the grain boundary phases due to the reaction of sintering aids and metallic particles at high sintering temperatures. Absorbed current measurements using SEM, as well as AFM in spreading resistance and STM in tunneling mode were used for visualization of electrical pathways.

    KW - AFM

    KW - Cermets

    KW - Diffusion

    KW - Electrical conductivity

    KW - Grain boundaries

    KW - SEM

    KW - STM

    KW - TEM

    UR - http://www.scopus.com/inward/record.url?scp=77949486715&partnerID=8YFLogxK

    UR - http://www.scopus.com/inward/citedby.url?scp=77949486715&partnerID=8YFLogxK

    U2 - 10.1016/j.matchar.2010.01.010

    DO - 10.1016/j.matchar.2010.01.010

    M3 - Article

    VL - 61

    SP - 420

    EP - 426

    JO - Materials Characterization

    T2 - Materials Characterization

    JF - Materials Characterization

    SN - 1044-5803

    IS - 4

    ER -