Slip system characterization of inconel 718: Using in-situ scanning electron microscopy

C. J. Boehlert, H. Li, L. Wang, B. Bartha

Research output: Contribution to journalArticle

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Abstract

In situ scanning electron microscopy (SEM) was applied on Inconel alloy 718 (IN 718) for slip system characterization and identification of the stress at which the slip systems were activated. Image acquisition time, which ranged between 60 and 90 seconds, revealed the displacement rate of 0.004 mm/s, which corresponds to a strain rate of approximately 10-3/s. Surface grain orientations with respect to the tensile direction identified using EBSD allowed for identification of the orientation of the slip planes. A Schmid factor, a geometrical measurement indicating the resolved shear stress on a specific slip system with respect to loading direction, of approximately zero indicates that a crystal is in a difficult orientation for activation of a particular slip system. The slip bands in grain 17 are found to have the highest Schmid factor of 0.46. Two activated slip systems are identified in grain 52 and grain 64.

LanguageEnglish (US)
Pages41-45
Number of pages5
JournalAdvanced Materials and Processes
Volume168
Issue number11
StatePublished - Nov 2010

Profile

Scanning electron microscopy
Image acquisition
Crystal orientation
Shear stress
Strain rate
Chemical activation
Crystals
Direction compound

ASJC Scopus subject areas

  • Materials Science(all)
  • Mechanics of Materials
  • Mechanical Engineering

Cite this

Slip system characterization of inconel 718 : Using in-situ scanning electron microscopy. / Boehlert, C. J.; Li, H.; Wang, L.; Bartha, B.

In: Advanced Materials and Processes, Vol. 168, No. 11, 11.2010, p. 41-45.

Research output: Contribution to journalArticle

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