Slip system characterization of inconel 718: Using in-situ scanning electron microscopy

C. J. Boehlert, H. Li, L. Wang, B. Bartha

    Research output: Research - peer-reviewArticle

    • 18 Citations

    Abstract

    In situ scanning electron microscopy (SEM) was applied on Inconel alloy 718 (IN 718) for slip system characterization and identification of the stress at which the slip systems were activated. Image acquisition time, which ranged between 60 and 90 seconds, revealed the displacement rate of 0.004 mm/s, which corresponds to a strain rate of approximately 10-3/s. Surface grain orientations with respect to the tensile direction identified using EBSD allowed for identification of the orientation of the slip planes. A Schmid factor, a geometrical measurement indicating the resolved shear stress on a specific slip system with respect to loading direction, of approximately zero indicates that a crystal is in a difficult orientation for activation of a particular slip system. The slip bands in grain 17 are found to have the highest Schmid factor of 0.46. Two activated slip systems are identified in grain 52 and grain 64.

    LanguageEnglish (US)
    Pages41-45
    Number of pages5
    JournalAdvanced Materials and Processes
    Volume168
    Issue number11
    StatePublished - Nov 2010

    Profile

    Scanning electron microscopy
    Direction compound
    Image acquisition
    Crystal orientation
    Shear stress
    Strain rate
    Chemical activation
    Crystals

    ASJC Scopus subject areas

    • Materials Science(all)
    • Mechanics of Materials
    • Mechanical Engineering

    Cite this

    Slip system characterization of inconel 718 : Using in-situ scanning electron microscopy. / Boehlert, C. J.; Li, H.; Wang, L.; Bartha, B.

    In: Advanced Materials and Processes, Vol. 168, No. 11, 11.2010, p. 41-45.

    Research output: Research - peer-reviewArticle

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