Subsurface Grain Morphology Reconstruction by Differential Aperture X-ray Microscopy

Philip Eisenlohr, Pratheek Shanthraj, Brendan R. Vande Kieft, Thomas R. Bieler, Wenjun Liu, Ruqing Xu

Research output: Contribution to journalArticle

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Abstract

A multistep, non-destructive grain morphology reconstruction methodology that is applicable to near-surface volumes is developed and tested on synthetic grain structures. This approach probes the subsurface crystal orientation using differential aperture x-ray microscopy on a sparse grid across the microstructure volume of interest. Resulting orientation data are clustered according to proximity in physical and orientation space and used as seed points for an initial Voronoi tessellation to (crudely) approximate the grain morphology. Curvature-driven grain boundary relaxation, simulated by means of the Voronoi implicit interface method, progressively improves the reconstruction accuracy. The similarity between bulk and readily accessible surface reconstruction error provides an objective termination criterion for boundary relaxation.

LanguageEnglish (US)
Pages1100-1105
Number of pages6
JournalJOM
Volume69
Issue number6
DOIs
StatePublished - Jun 1 2017

Profile

Microscopic examination
X rays
Surface reconstruction
Crystal microstructure
Crystal orientation
Seed
Grain boundaries
Microstructure

ASJC Scopus subject areas

  • Materials Science(all)
  • Engineering(all)

Cite this

Subsurface Grain Morphology Reconstruction by Differential Aperture X-ray Microscopy. / Eisenlohr, Philip; Shanthraj, Pratheek; Vande Kieft, Brendan R.; Bieler, Thomas R.; Liu, Wenjun; Xu, Ruqing.

In: JOM, Vol. 69, No. 6, 01.06.2017, p. 1100-1105.

Research output: Contribution to journalArticle

Eisenlohr, P, Shanthraj, P, Vande Kieft, BR, Bieler, TR, Liu, W & Xu, R 2017, 'Subsurface Grain Morphology Reconstruction by Differential Aperture X-ray Microscopy' JOM, vol 69, no. 6, pp. 1100-1105. DOI: 10.1007/s11837-017-2357-z
Eisenlohr P, Shanthraj P, Vande Kieft BR, Bieler TR, Liu W, Xu R. Subsurface Grain Morphology Reconstruction by Differential Aperture X-ray Microscopy. JOM. 2017 Jun 1;69(6):1100-1105. Available from, DOI: 10.1007/s11837-017-2357-z
Eisenlohr, Philip ; Shanthraj, Pratheek ; Vande Kieft, Brendan R. ; Bieler, Thomas R. ; Liu, Wenjun ; Xu, Ruqing. / Subsurface Grain Morphology Reconstruction by Differential Aperture X-ray Microscopy. In: JOM. 2017 ; Vol. 69, No. 6. pp. 1100-1105
@article{45d36e36731d4e039ab51476e7fb843b,
title = "Subsurface Grain Morphology Reconstruction by Differential Aperture X-ray Microscopy",
abstract = "A multistep, non-destructive grain morphology reconstruction methodology that is applicable to near-surface volumes is developed and tested on synthetic grain structures. This approach probes the subsurface crystal orientation using differential aperture x-ray microscopy on a sparse grid across the microstructure volume of interest. Resulting orientation data are clustered according to proximity in physical and orientation space and used as seed points for an initial Voronoi tessellation to (crudely) approximate the grain morphology. Curvature-driven grain boundary relaxation, simulated by means of the Voronoi implicit interface method, progressively improves the reconstruction accuracy. The similarity between bulk and readily accessible surface reconstruction error provides an objective termination criterion for boundary relaxation.",
author = "Philip Eisenlohr and Pratheek Shanthraj and {Vande Kieft}, {Brendan R.} and Bieler, {Thomas R.} and Wenjun Liu and Ruqing Xu",
year = "2017",
month = "6",
day = "1",
doi = "10.1007/s11837-017-2357-z",
language = "English (US)",
volume = "69",
pages = "1100--1105",
journal = "JOM",
issn = "1047-4838",
publisher = "Minerals, Metals and Materials Society",
number = "6",

}

TY - JOUR

T1 - Subsurface Grain Morphology Reconstruction by Differential Aperture X-ray Microscopy

AU - Eisenlohr,Philip

AU - Shanthraj,Pratheek

AU - Vande Kieft,Brendan R.

AU - Bieler,Thomas R.

AU - Liu,Wenjun

AU - Xu,Ruqing

PY - 2017/6/1

Y1 - 2017/6/1

N2 - A multistep, non-destructive grain morphology reconstruction methodology that is applicable to near-surface volumes is developed and tested on synthetic grain structures. This approach probes the subsurface crystal orientation using differential aperture x-ray microscopy on a sparse grid across the microstructure volume of interest. Resulting orientation data are clustered according to proximity in physical and orientation space and used as seed points for an initial Voronoi tessellation to (crudely) approximate the grain morphology. Curvature-driven grain boundary relaxation, simulated by means of the Voronoi implicit interface method, progressively improves the reconstruction accuracy. The similarity between bulk and readily accessible surface reconstruction error provides an objective termination criterion for boundary relaxation.

AB - A multistep, non-destructive grain morphology reconstruction methodology that is applicable to near-surface volumes is developed and tested on synthetic grain structures. This approach probes the subsurface crystal orientation using differential aperture x-ray microscopy on a sparse grid across the microstructure volume of interest. Resulting orientation data are clustered according to proximity in physical and orientation space and used as seed points for an initial Voronoi tessellation to (crudely) approximate the grain morphology. Curvature-driven grain boundary relaxation, simulated by means of the Voronoi implicit interface method, progressively improves the reconstruction accuracy. The similarity between bulk and readily accessible surface reconstruction error provides an objective termination criterion for boundary relaxation.

UR - http://www.scopus.com/inward/record.url?scp=85018313382&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=85018313382&partnerID=8YFLogxK

U2 - 10.1007/s11837-017-2357-z

DO - 10.1007/s11837-017-2357-z

M3 - Article

VL - 69

SP - 1100

EP - 1105

JO - JOM

T2 - JOM

JF - JOM

SN - 1047-4838

IS - 6

ER -