Subsurface Grain Morphology Reconstruction by Differential Aperture X-ray Microscopy

Philip Eisenlohr, Pratheek Shanthraj, Brendan R. Vande Kieft, Thomas R. Bieler, Wenjun Liu, Ruqing Xu

    Research output: Research - peer-reviewArticle

    Abstract

    A multistep, non-destructive grain morphology reconstruction methodology that is applicable to near-surface volumes is developed and tested on synthetic grain structures. This approach probes the subsurface crystal orientation using differential aperture x-ray microscopy on a sparse grid across the microstructure volume of interest. Resulting orientation data are clustered according to proximity in physical and orientation space and used as seed points for an initial Voronoi tessellation to (crudely) approximate the grain morphology. Curvature-driven grain boundary relaxation, simulated by means of the Voronoi implicit interface method, progressively improves the reconstruction accuracy. The similarity between bulk and readily accessible surface reconstruction error provides an objective termination criterion for boundary relaxation.

    LanguageEnglish (US)
    Pages1100-1105
    Number of pages6
    JournalJOM
    Volume69
    Issue number6
    DOIs
    StatePublished - Jun 1 2017

    Profile

    Microscopic examination
    X rays
    Surface reconstruction
    Crystal microstructure
    Crystal orientation
    Seed
    Grain boundaries
    Microstructure

    ASJC Scopus subject areas

    • Materials Science(all)
    • Engineering(all)

    Cite this

    Subsurface Grain Morphology Reconstruction by Differential Aperture X-ray Microscopy. / Eisenlohr, Philip; Shanthraj, Pratheek; Vande Kieft, Brendan R.; Bieler, Thomas R.; Liu, Wenjun; Xu, Ruqing.

    In: JOM, Vol. 69, No. 6, 01.06.2017, p. 1100-1105.

    Research output: Research - peer-reviewArticle

    Eisenlohr, P, Shanthraj, P, Vande Kieft, BR, Bieler, TR, Liu, W & Xu, R 2017, 'Subsurface Grain Morphology Reconstruction by Differential Aperture X-ray Microscopy' JOM, vol 69, no. 6, pp. 1100-1105. DOI: 10.1007/s11837-017-2357-z
    Eisenlohr P, Shanthraj P, Vande Kieft BR, Bieler TR, Liu W, Xu R. Subsurface Grain Morphology Reconstruction by Differential Aperture X-ray Microscopy. JOM. 2017 Jun 1;69(6):1100-1105. Available from, DOI: 10.1007/s11837-017-2357-z
    Eisenlohr, Philip ; Shanthraj, Pratheek ; Vande Kieft, Brendan R. ; Bieler, Thomas R. ; Liu, Wenjun ; Xu, Ruqing. / Subsurface Grain Morphology Reconstruction by Differential Aperture X-ray Microscopy. In: JOM. 2017 ; Vol. 69, No. 6. pp. 1100-1105
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