Validation of the simple infiltrated microstructure polarization loss estimation (SIMPLE) model using single layer, nano-composite Sm 0.5Sr0.5CoO3-x-Ce0.9Gd 0.1O1.95 solid oxide fuel cell cathodes

Jason D. Nicholas, Scott A. Barnett

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    • 1 Citations

    Abstract

    Single-layer nano-composite Sm0.5Sr0.5CoO 3-x (SSC) - Ce0.9Gd0.1O1.95 (GDC) Solid Oxide Fuel Cell (SOFC) cathodes with various SSC loading levels were prepared through multiple nitrate solution infiltrations. Microstructural analyses indicated that the average infiltrate hemispherical particle radius remained roughly constant, at 25nm, across multiple infiltrate-gel-800°C fire sequences. Symmetric cell polarization resistance measurements of cathode performance showed that the Simple Infiltrated Microstructure Polarization Loss Estimation (SIMPLE) model, which accounts for electrical losses associated with surface oxygen incorporation and bulk oxygen transport, was able to predict the performance of heavily infiltrated cathodes to within 55% (without the use of fitting parameters) at all temperatures from 400-700°C. Results also indicate that electronic conduction losses limited the overall cathode performance at low and medium SSC infiltrate loading levels.

    Original languageEnglish (US)
    Title of host publicationECS Transactions
    Pages39-58
    Number of pages20
    Volume28
    Edition11
    DOIs
    StatePublished - 2010
    EventIonic and Mixed Conducting Ceramics 7 - 217th ECS Meeting - Vancouver, BC, Canada

    Other

    OtherIonic and Mixed Conducting Ceramics 7 - 217th ECS Meeting
    CountryCanada
    CityVancouver, BC
    Period4/25/104/30/10

    Profile

    Cathodes
    Polarization
    Solid oxide fuel cells (SOFC)
    Microstructure
    Oxygen
    Composite materials
    Infiltration
    Nitrates
    Fires
    Gels
    Temperature

    ASJC Scopus subject areas

    • Engineering(all)

    Cite this

    Validation of the simple infiltrated microstructure polarization loss estimation (SIMPLE) model using single layer, nano-composite Sm 0.5Sr0.5CoO3-x-Ce0.9Gd 0.1O1.95 solid oxide fuel cell cathodes. / Nicholas, Jason D.; Barnett, Scott A.

    ECS Transactions. Vol. 28 11. ed. 2010. p. 39-58.

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    Nicholas, JD & Barnett, SA 2010, Validation of the simple infiltrated microstructure polarization loss estimation (SIMPLE) model using single layer, nano-composite Sm 0.5Sr0.5CoO3-x-Ce0.9Gd 0.1O1.95 solid oxide fuel cell cathodes. in ECS Transactions. 11 edn, vol. 28, pp. 39-58, Ionic and Mixed Conducting Ceramics 7 - 217th ECS Meeting, Vancouver, BC, Canada, 25-30 April. DOI: 10.1149/1.3495831

    Nicholas, Jason D.; Barnett, Scott A. / Validation of the simple infiltrated microstructure polarization loss estimation (SIMPLE) model using single layer, nano-composite Sm 0.5Sr0.5CoO3-x-Ce0.9Gd 0.1O1.95 solid oxide fuel cell cathodes.

    ECS Transactions. Vol. 28 11. ed. 2010. p. 39-58.

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

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